Reference : Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requi...
Scientific congresses and symposiums : Paper published in a book
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/75164
Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements
English
Vandenrijt, Jean-François mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Thizy, Cédric mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Alexeenko, Igor [Universität Stuttgart > Institut für Technische Optik > > >]
Jorge, Iagoba [Centro de Tecnologias Aeronauticas > > > >]
Lopez, Ion [Centro de Tecnologias Aeronauticas > > > >]
Saez de Ocariz, Idurre [Centro de Tecnologias Aeronauticas > > > >]
Pedrini, Giancarlo [Universität Stuttgart > Institut für Technische Optik > > > >]
Osten, Wolfgang [Universität Stuttgart > Institut für Technische Optik > > >]
Georges, Marc mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Sep-2009
Fringe 2009
Osten, Wolfgang
Kujawinska, Malgorzata
Springer
596-599
No
No
International
978-3-642-03050-5
Berlin
Allemagne
Fringe 2009 - 6th International Workshop on Advanced Optical Metrology
du 14 au 16 septembre 2009
Universität Stuttgart
Nürtingen
Allemagne
[en] Infrared ; Speckle Interferometry
Union Européenne = European Union - UE = EU
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/75164

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