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Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements
Vandenrijt, Jean-François; Thizy, Cédric; Alexeenko, Igor et al.
2009 • In Osten, Wolfgang; Kujawinska, Malgorzata (Eds.) Fringe 2009

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Vandenrijt_Fringe09_manuscript.pdf

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