Reference : Almost-common path interferometer using the separation of polarization states for dig...
Scientific journals : Article
Engineering, computing & technology : Electrical & electronics engineering
http://hdl.handle.net/2268/98578
Almost-common path interferometer using the separation of polarization states for digital phase-shifting shearography
English
Rosso, Vanessa mailto [Université de Liège - ULg > HEC-Ecole de gestion de l'ULg : UER > Mathématiques appliquées aux sc. économiques et de gestion >]
Michel, Fabrice mailto [Université de Liège - ULg > > > Doct. sc. (physique - Bologne)]
Renotte, Yvon mailto [Université de Liège - ULg > Département de physique > Optique - Hololab >]
Habraken, Serge mailto [Université de Liège - ULg > Département de physique > Optique - Hololab >]
Lion, Yves [> >]
Tilkens, bernard [> >]
Moreau, vincent [> >]
Oct-2007
Optical Engineering : The Journal of the Society of Photo-Optical Instrumentation Engineers
International Society of Optical Engineering
46
10
Yes (verified by ORBi)
International
0091-3286
Bellingham
WA
[en] shearography ; interferometry ; metrology
[en] An original experimental setup for shearography with metrological applications is presented. The simplicity and the efficiency of the setup are provided by a shearing device, a prism that separates the TE and TM polarization modes with a coating and a thin glass plate placed on its face. The use of this shearing device enables an in-line and almost-common path configuration for the shearing interferometer, a path that leads to high stability and a low sensitivity to external disturbances. Moreover, the sensitivity of the interferometer can be easily adjusted for different applications by varying the shearing amount with glass plates of different thicknesses or by moving the shearing device between two lenses along the optical axis. The temporal phase-shifting method is applied through the use of a liquid crystal variable retarder. (c) 2007 Society of Photo-Optical Instrumentation Engineers.
Service de Physique Générale, Hololab
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/98578
http://hdl.handle.net/2268/12776

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