Reference : Using a Savart plate in optical metrology
Scientific congresses and symposiums : Paper published in a journal
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/97427
Using a Savart plate in optical metrology
English
[fr] Uilisation d'une lame de Savart en métrologie optique
Blain, Pascal mailto [Université de Liège - ULg > Département de physique > Optique - Hololab >]
Michel, Fabrice mailto [Université de Liège - ULg > > > Doct. sc. (physique - Bologne)]
Renotte, Yvon mailto [Université de Liège - ULg > Département de physique > Optique - Hololab >]
Habraken, Serge mailto [Université de Liège - ULg > Département de physique > Optique - Hololab >]
Aug-2010
Proceedings of SPIE
7791
No
No
International
0277-786X
Interferometry XV: application
SPIE
San Diego
USA
[en] shearography ; metrology ; savart
[en] Non-contact optical measurement methods are essential tools in many industrial and research domains. A family of new non-contact optical measurement methods based on the polarization states splitting technique and monochromatic light projection as a way to overcome ambient lighting for in-situ measurement has been developed1,2. Recent works3 on a birefringent element, a Savart plate, allow to build a more flexible and robust interferometer. This interferometer is a multipurpose metrological device. On one hand, the interferometer can be set in front of a CCD camera. This optical measurement system is called a shearography interferometer and allows to measure micro displacement between two states of the studied object under coherent lighting. On the other hand, by producing and shifting multiple sinusoidal Young’s interference patterns with this interferometer, and using a CCD camera, it is possible to build a 3D structured light profilometer. After giving the behavior of the Savart plate, an overview of the two devices will be given as well as their specifications and some applications.
Hololab, University of Liège
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/97427
10.1117/12.860177
http://dx.doi.org/10.1117/12.860177

File(s) associated to this reference

Fulltext file(s):

FileCommentaryVersionSizeAccess
Restricted access
Using a Savart plate in optical metrology.pdfAuthor preprint3.56 MBRequest copy

Bookmark and Share SFX Query

All documents in ORBi are protected by a user license.