Reference : High transmission efficiency for surface plasmon resonance by use of a dielectric grating
Scientific journals : Article
Engineering, computing & technology : Electrical & electronics engineering
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/77592
High transmission efficiency for surface plasmon resonance by use of a dielectric grating
English
Lenaerts, Cedric mailto [Université de Liège - ULg > Département de physique > HOLOLAB > >]
Michel, Fabrice mailto [Université de Liège - ULg > Département de physique > HOLOLAB > Doct. sc. (physique - Bologne) >]
Tilkens, Bernard [Université de Liège - ULG > Département de physique > HOLOLAB > >]
Lion, Yves [Université de Liège - ULG > Département de physique > HOLOLAB > >]
Renotte, Yvon mailto [Université de Liège - ULg > Département de physique > HOLOLAB > >]
1-Oct-2005
Applied Optics
Optical Society of America
44
28
6017-6022
Yes (verified by ORBi)
International
0003-6935
1539-4522
Washington
DC
[en] surface plasmon resonance ; dielectric grating ; rcwa
[en] The efficiency of the transmission of surface plasmon waves by use of a dielectric diffraction grating is discussed. The Kretschmann device allows us to obtain a surface plasmon resonance that consists of an absorption peak in the reflection spectrum. When surface plasmon resonance occurs, the TM-polarization mode of the incident electromagnetic wave is neither transmitted nor reflected. The procedure to transform an absorption peak into a transmission peak is described. Transmittivity of 68% is obtained for a simple structure that consists of a thin-film layer of Ag coated on a volume diffraction grating and embedded between two dielectric media. The results presented herein were obtained by numerical simulations that were carried out by use of an algorithm based on the rigorous coupled-wave theory.
Service de Physique Générale, Hololab
Fonds pour la formation à la Recherche dans l'Industrie et dans l'Agriculture (Communauté française de Belgique) - FRIA
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/77592
also: http://hdl.handle.net/2268/96932

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