Reference : Sequential Adaptive tailored Testing and Confidence Marking

	Document type :	Scientific congresses and symposiums : Unpublished conference
	Discipline(s) :	Social & behavioral sciences, psychology : Education & instruction
	To cite this reference:	http://hdl.handle.net/2268/93352

Title :	Sequential Adaptive tailored Testing and Confidence Marking
Language :	English
Author, co-author :	Leclercq, Dieudonné [Université de Liège - ULg > Département d'éducation et formation > Département d'éducation et formation >]
Publication date :	1977
Page number :	10
On invitation :	No
Audience :	International
Event name :	3rd International Symposium on Educational Testing
Event date :	27-29 juin 1977
Event organizer :	Educational testing Service (ETS) and University of Leyden
Event place (city) :	Leyden
Event country :	Hollande
Keywords :	[en] tailored testing ; adaptive testing ; confidence degrees ; scoring rules ; pay-off matrixes ; subjective probabilities ; educational testing ; branching rule ; starting rule ; wits ; rasch model ; exponential logistic function
Abstract :	[en] Starting from the rasch model, the author explains how to take advantage in Confidence degrees given by the testee to concezive the starting rules, the branching rules and the stopping rules of an adaptive tailored testing. Note : These co,nsiderations have been deepened in a more recent publication : Leclercq (1982) "Confidence Marking. Its use in testing".
Permalink :	http://hdl.handle.net/2268/93352

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	Fulltext file(s): File Commentary Version Size Access Open access 1977 Sequential adaptive Tailored Testing Leiden.pdf Publisher postprint 623.53 kB View/Open

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