Reference : The technical challenges of the Solar-Orbiter EUI instrument
Scientific congresses and symposiums : Paper published in a journal
Engineering, computing & technology : Aerospace & aeronautics engineering
http://hdl.handle.net/2268/91656
The technical challenges of the Solar-Orbiter EUI instrument
English
Halain, Jean-Philippe mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Rochus, Pierre mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Renotte, Etienne mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Defise, Jean-Marc mailto [Université de Liège - ULg > Département d'astrophys., géophysique et océanographie (AGO) > Satellites, missions et instruments spatiaux >]
Rossi, Laurence mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Jacques, Lionel mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
2010
Proceedings - Society of Photo-Optical Instrumentation Engineers
7732
26
No
No
International
1018-4732
SPIE Astronomical Telescopes and Instrumentation
June 2010
San Diego
United States
[en] Extreme Ultraviolet Imager ; Full Sun Imager ; High-Resolution Imager ; Solar Orbiter ; Transmission Filter ; APS detector ; Bandpass coating
[en] The Extreme Ultraviolet Imager (EUI) onboard Solar Orbiter consists of a suite of two high-resolution imagers (HRI) and one dual-band full Sun imager (FSI) that will provide EUV and Lyman-α images of the solar atmospheric layers above the photosphere.
The EUI instrument is based on a set of challenging new technologies allowing to reach the scientific objectives and to cope with the hard space environment of the Solar Orbiter mission.
The mechanical concept of the EUI instrument is based on a common structure supporting the HRI and FSI channels, and a separated electronic box. A heat rejection baffle system is used to reduce the Sun heat load and provide a first protection level against the solar disk straylight. The spectral bands are selected by thin filters and multilayer mirror coatings. The detectors are 10µm pitch back illuminated CMOS Active Pixel Sensors (APS), best suited for the EUI science requirements and radiation hardness.
This paper presents the EUI instrument concept and its major sub-systems. The current developments of the instrument technologies are also summarized.
Centre Spatial de Liège - CSL
The Belgian institutions are funded by Belgian Federal Science Policy Office; the French institutions by Centre National d'Etudes Spatiales (CNES), the UK institution by the UK Space Agency (UKSA); and the German institution by Deutsche Zentrum für Luft- und Raumfahrt e.V. (DLR).
EUI on Solar Orbiter
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/91656

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