Article (Scientific journals)
Attempts for molecular depth profiling directly on a rat brain tissue section using fullerene and bismuth cluster ion beams
Debois, Delphine; Brunelle, Alain; Laprévote, Olivier
2007In International Journal of Mass Spectrometry, 260 (2-3), p. 115-120
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Keywords :
Imaging Mass Spectrometry; Depth profiling; Fullerene; Biological tissue; Time-of-Flight; Secondary Ion Mass Spectrometry
Disciplines :
Chemistry
Author, co-author :
Debois, Delphine ;  ICSN-CNRS > Laboratoire de Spectrométrie de Masse
Brunelle, Alain;  ICNS-CNRS > Laboratoire de Spectrométrie de Masse
Laprévote, Olivier;  ICSN-CNRS > Laboratoire de Spectrométrie de Masse
Language :
English
Title :
Attempts for molecular depth profiling directly on a rat brain tissue section using fullerene and bismuth cluster ion beams
Publication date :
February 2007
Journal title :
International Journal of Mass Spectrometry
ISSN :
1387-3806
Publisher :
Elsevier Science, Amsterdam, Netherlands
Volume :
260
Issue :
2-3
Pages :
115-120
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 04 February 2011

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