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A Perturbation Method for the 3D Finite Element Modeling of Electrostaticaly Driven MEMS
Boutaayamou, Mohamed; V Sabariego, Ruth; Dular, Patrick
2007In Proceedings of the 8th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems
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Abstract :
[en] In this paper, a finite element (FE) procedure for modeling electrostatically actuated MEMS is presented. It concerns a perturbation method for computing electrostatic field distortions due to moving conductors. The computation is split in two steps. First, an unperturbed problem (in the absence of certain conductors) is solved with the conventional FE method in the complete domain. Second, a perturbation problem is solved in a reduced region with an additional conductor using the solution of the unperturbed problem as a source. When the perturbing regions are close to the original source field, an iterative computation may be required. The developed procedure offers the advantage of solving sub-problems in reduced domains and consequently of benefiting from different problem-adapted meshes. This approach allows for computational efficiency by decreasing the size of the problem.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Boutaayamou, Mohamed ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Capteurs et systèmes de mesures électriques
V Sabariego, Ruth ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE)
Dular, Patrick ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE)
Language :
English
Title :
A Perturbation Method for the 3D Finite Element Modeling of Electrostaticaly Driven MEMS
Publication date :
April 2007
Event name :
8th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE2007)
Event place :
London, United Kingdom
Event date :
April 16-18, 2007
Audience :
International
Main work title :
Proceedings of the 8th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems
Main work alternative title :
[en] Proceedings of EuroSimE2007
Publisher :
IEEE
ISBN/EAN :
1-4244-1105-X
Collection name :
IEEE Catalog Number: 07EX1736
Pages :
50-54
Peer reviewed :
Peer reviewed
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