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Electronic speckle pattern interferometry in Long Wave Infrared: a new technique for combining temperature and displacement measurements. Applications in thermo-mechanical assessment of structures
Georges, Marc; Vandenrijt, Jean-François; Thizy, Cédric et al.
2010In Proceedings of ICSO 2010 - International Conference on Space Optics
 

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Disciplines :
Physics
Author, co-author :
Georges, Marc ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Vandenrijt, Jean-François  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Thizy, Cédric ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Stockman, Yvan ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Alexeenko, Igor
Language :
English
Title :
Electronic speckle pattern interferometry in Long Wave Infrared: a new technique for combining temperature and displacement measurements. Applications in thermo-mechanical assessment of structures
Publication date :
October 2010
Event name :
ICSO 2010 - International Conference on Space Optics
Event organizer :
European Space Agency
Event place :
Rhodes, Greece
Event date :
4-8 October 2010
Audience :
International
Main work title :
Proceedings of ICSO 2010 - International Conference on Space Optics
Publisher :
European Space Agency, Noordwijk, Netherlands
Available on ORBi :
since 24 January 2011

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