Reference : Electronic speckle pattern interferometry in Long Wave Infrared: a new technique for com...
Scientific congresses and symposiums : Paper published in a book
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/82708
Electronic speckle pattern interferometry in Long Wave Infrared: a new technique for combining temperature and displacement measurements. Applications in thermo-mechanical assessment of structures
English
Georges, Marc mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Vandenrijt, Jean-François mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Thizy, Cédric mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Stockman, Yvan mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Alexeenko, Igor [> >]
Oct-2010
Proceedings of ICSO 2010 - International Conference on Space Optics
European Space Agency
No
No
International
Noordwijk
Netherlands
ICSO 2010 - International Conference on Space Optics
4-8 October 2010
European Space Agency
Rhodes
Greece
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/82708

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