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Focii determination of an off axis ellipsoid : Theory to practice
Houbrechts, Yvette; Roose, Stéphane; Stockman, Yvan
2004In Osten, W.; Novak, E. (Eds.) Proceedings of the Eighth International Conference on Laser and Laser Information Technologies
 

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Keywords :
Optical metrology; Geometrical optics; Interferometry
Abstract :
[en] In the frame of cryogenic test on an off axis ellipsoid, it has been required to set-up an unambiguous method to determine and track the foci position during temperature transitions. This procedure was mandatory to avoid: (1) impact of the operator skills working on triple shift scheme to assure continuously monitoring of the ellipsoid shape during cool down. (2) correctly dissociate the impact of the thermal deformation on the mirror shape with respect to alignment errors. This paper will demonstrate the process, starting from ideal ellipsoid shape, then introducing 3D metrology data in a model, and finally presents the results in a practical situation.
Disciplines :
Aerospace & aeronautics engineering
Author, co-author :
Houbrechts, Yvette ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Roose, Stéphane  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Stockman, Yvan ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Language :
English
Title :
Focii determination of an off axis ellipsoid : Theory to practice
Publication date :
02 August 2004
Event name :
Eighth International Conference on Laser and Laser Information Technologies
Event organizer :
SPIE
Event place :
Denver, United States
Event date :
August 2004
Audience :
International
Main work title :
Proceedings of the Eighth International Conference on Laser and Laser Information Technologies
Main work alternative title :
[en] Interferometry XII: Applications
Editor :
Osten, W.
Novak, E.
Publisher :
SPIE, Bellingham, United States
ISBN/EAN :
9780819454706
Collection name :
Proc. SPIE 5532
Available on ORBi :
since 17 January 2011

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