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Cryo-optical testing of large aspheric reflectors operating in the sub mm range
Roose, Stéphane; Houbrechts, Yvette; Mazzoli, Alexandra et al.
2005In Zhang, Y.; Jiang, W.; Cho, M. (Eds.) Proceedings of the 2nd SPIE symposium on Advanced Optical Manufacturing and Testing Technologies
 

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Keywords :
Interferometry; Cryogenic test; CFRP
Abstract :
[en] The cryo-optical testing of the PLANCK primary reflector (elliptical off-axis CFRP reflector of 1550 mm x 1890 mm) is one of the major issue in the payload development program. It is requested to measure the changes of the Surface Figure Error (SFE) with respect to the best ellipsoid, between 293 K and 50 K, with a 1 μm RMS accuracy. To achieve this, Infra Red interferometry has been used and a dedicated thermo mechanical set-up has been constructed. This paper summarises the test activities, the test methods and results on the PLANCK Primary Reflector - Flight Model (PRFM) achieved in FOCAL 6.5 at Centre Spatial de Liege (CSL). Here, the Wave Front Error (WFE) will be considered, the SFE can be derived from the WFE measurement. After a brief introduction, the first part deals with the general test description. The thermo-elastic deformations will be addressed: the surface deformation in the medium frequency range (spatial wavelength down to 60 mm) and core-cell dimpling.
Disciplines :
Aerospace & aeronautics engineering
Author, co-author :
Roose, Stéphane  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Houbrechts, Yvette ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Mazzoli, Alexandra  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Ninane, Nathalie ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Stockman, Yvan ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Daddato, Robert;  ESA > ESTEC
Venancio, Luis;  ESA > ESTEC
Kirschner, Volker;  ESA > ESTEC
De Chambure, Daniel;  ESA > ESTEC
Language :
English
Title :
Cryo-optical testing of large aspheric reflectors operating in the sub mm range
Publication date :
August 2005
Event name :
2nd SPIE symposium on Advanced Optical Manufacturing and Testing Technologies
Event organizer :
SPIE
Event place :
Xian, China
Event date :
August 2005
Audience :
International
Main work title :
Proceedings of the 2nd SPIE symposium on Advanced Optical Manufacturing and Testing Technologies
Editor :
Zhang, Y.
Jiang, W.
Cho, M.
Publisher :
SPIE, Bellingham, United States
ISBN/EAN :
9780819461872
Collection name :
Prc. SPIE 6148
Available on ORBi :
since 17 December 2010

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