Article (Scientific journals)
The Numerical Modeling and Measurement of Demagnetization Effect in Bulk YBCO Superconductors Subjected to Transverse Field
Hong, Z.; Vanderbemden, Philippe; Pei, R. et al.
2008In IEEE Transactions on Applied Superconductivity, 18 (2), p. 1561-1564
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Keywords :
superconductors; critical state; numerical modeling
Abstract :
[en] In this paper, the crossed field demagnetization effect of the bulk type-II superconducting materials in a variety of external magnetic field condition has been investigated both numerically and experimentally. A melt-textured YBCO bulk sample was magnetized along the axial direction and after that a transverse field perpendicular to the central axis applied. The collapse of the original trapped field was measured using a Quantum Design Physical Property Measurement System. A numerical solver based on critical state model is proposed to simulate the measured results. (C) 2008 IEEE.
Research center :
SUPRATECS - Services Universitaires pour la Recherche et les Applications Technologiques de Matériaux Électro-Céramiques, Composites, Supraconducteurs - ULiège
Disciplines :
Electrical & electronics engineering
Physics
Author, co-author :
Hong, Z.;  University of Cambridge > Engineering Department
Vanderbemden, Philippe  ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Capteurs et systèmes de mesures électriques
Pei, R.;  University of Cambridge > Engineering Department
Jiang, Y.;  University of Cambridge > Engineering Department
Campbell, A. M.;  University of Cambridge > Engineering Department
Coombs, T. A.;  University of Cambridge > Engineering Department
Language :
English
Title :
The Numerical Modeling and Measurement of Demagnetization Effect in Bulk YBCO Superconductors Subjected to Transverse Field
Publication date :
2008
Journal title :
IEEE Transactions on Applied Superconductivity
ISSN :
1051-8223
Publisher :
IEEE, New York, United States - New York
Volume :
18
Issue :
2
Pages :
1561-1564
Peer reviewed :
Peer Reviewed verified by ORBi
Funders :
F.R.S.-FNRS - Fonds de la Recherche Scientifique [BE]
Commentary :
©2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
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