Reference : Holographic interferometry with photorefractive crystals : recent industrial applications
Scientific congresses and symposiums : Paper published in a book
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/78434
Holographic interferometry with photorefractive crystals : recent industrial applications
English
Thizy, Cédric mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Georges, Marc mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Hustinx, Guy-Michel [ > > ]
Lemaire, Philippe [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Oct-2008
Proceedings of the International Symposium to Commemorate the 60th Anniversary of the Invention of Holography
Society for Experimental Mechanics
324-331
No
No
International
978-1-935116-01-1
Bethel, CT
USA
International Symposium to Commemorate the 60th Anniversary of the Invention of Holography
27-29 October 2008
Society for Experimental Mechanics
Springfield, MA
USA
[en] photorefractive crystals ; holographic interferometry ; non destructive testing ; industrial applications ; space applications
[en] Photorefractive crystals allow in-situ dynamic holographic recording and indefinite reusability. Also they exhibit specific properties that other recording materials do not and which can be advantageously used in holographic interferometry. For 15 years we have been developing holographic interferometry techniques and devices with Bi12SiO20 (BSO) crystals. The dynamic behaviour of the latter allows a high degree of userfriendliness of holographic interferometry (like techniques based on electronic recording), together with higher resolution interferograms (no speckle noise - no need of filtering). In the past we already have presented a wide range of applications in metrology, NDT and vibrations measurement. Here we present recent industrial applications obtained with a device which is now commercially available. It has proven successful applications in highly demanding applications where high resolution was required
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/78434

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