Analysis of thin layers for photovoltaic application: Comparison between RBS and ellipsometry on the determination of roughness and porosity

Mathis, François; Dewalque, Jennifer; Dubreuil, Olivier; Henrist, Catherine; Delhalle, René; Spronck, Gilles; Colson, Pierre; Cloots, Rudi; Strivay, David

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Poster (Scientific congresses and symposiums)

Analysis of thin layers for photovoltaic application: Comparison between RBS and ellipsometry on the determination of roughness and porosity

Mathis, François; Dewalque, Jennifer; Dubreuil, Olivier et al.

2010 • 10th European Conference on Accelerators in Applied Research and Technology

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https://hdl.handle.net/2268/76890

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Disciplines :

Physical, chemical, mathematical & earth Sciences: Multidisciplinary, general & others

Author, co-author :

Mathis, François ; Université de Liège - ULiège > Centre européen en archéométrie - Physique nucléaire, atomique et spectroscopie

Dewalque, Jennifer ; Université de Liège - ULiège > Département de chimie (sciences) > LCIS - GreenMAT

Dubreuil, Olivier ; Université de Liège - ULiège > Département de chimie (sciences) > LCIS - GreenMAT

Henrist, Catherine ; Université de Liège - ULiège > Département de chimie (sciences) > LCIS - GreenMAT

Delhalle, René ; Université de Liège - ULiège > HEC-Ecole de gestion : UER > UER Opérations

Spronck, Gilles ; Université de Liège - ULiège > Département de chimie (sciences) > LCIS - GreenMAT

Colson, Pierre ; Université de Liège - ULiège > Département de chimie (sciences) > LCIS - GreenMAT

Cloots, Rudi ; Université de Liège - ULiège > Département de chimie (sciences) > LCIS - GreenMAT - Doyen de la Faculté des Sciences

Strivay, David ; Université de Liège - ULiège > Département de physique > Physique nucléaire, atomique et spectroscopie - Centre européen en archéométrie

Language :

English

Title :

Analysis of thin layers for photovoltaic application: Comparison between RBS and ellipsometry on the determination of roughness and porosity

Publication date :

2010

Event name :

10th European Conference on Accelerators in Applied Research and Technology

Event place :

Athènes, Greece

Event date :

13-17 septembre 2010

Audience :

International

Available on ORBi :

since 24 November 2010

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