Reference : Condensation-Induced Decrease of Small-Angle X-ray Scattering Intensity in Gelling Si...
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
Physical, chemical, mathematical & earth Sciences : Chemistry
http://hdl.handle.net/2268/75760
Condensation-Induced Decrease of Small-Angle X-ray Scattering Intensity in Gelling Silica Solutions
English
Gommes, Cédric mailto [Université de Liège - ULg > Département de chimie appliquée > Génie chimique - Génie catalytique >]
Pirard, Jean-Paul mailto [Université de Liège - ULg > Département de chimie appliquée > Génie chimique - Génie catalytique >]
Goderis, Bart [Katholieke Universiteit Leuven - KUL > > > >]
2010
Journal of Physical Chemistry C: Nanomaterials, Interfaces, and Hard Matter
American Chemical Society
114
17350–17357
Yes (verified by ORBi)
International
1932-7447
1932-7455
Washington
DC
[en] SAXS ; Silica gels ; condensation
[en] We propose a mathematical modeling of the total SAXS intensity in silica sol-gel processes in terms of hydrolysis and condensation reactions, as well as of microsyneresis. The results are used to rationalize previously published SAXS data of TEOS solutions reacting with organically modified trialkoxysilanes. We notably show that the decrease in SAXS intensity reported for these samples at the end of gelation is a consequence of condensation reactions. The water released by the latter reactions contributes to reduce the electron density difference between the silica and the solvent phases of the gels
Fonds de la Recherche Scientifique (Communauté française de Belgique) - F.R.S.-FNRS
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/75760

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