Reference : Electronic Speckle Pattern Interferometry at Long Wave Infrared Wavelengths. Scattering ...
Scientific congresses and symposiums : Paper published in a book
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/75163
Electronic Speckle Pattern Interferometry at Long Wave Infrared Wavelengths. Scattering Requirements
English
Vandenrijt, Jean-François mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Thizy, Cédric mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Alexeenko, Igor [ > > ]
Jorge, Iagoba [ > > ]
Lopez, Ion [Université de Liège - ULg > > > >]
Sep-2009
Fringe 2009
Springer
596-599
No
No
International
Fringe 2009
14-16 September 2009
Institut für Teknische Optik
Nürtingen
Germany
http://hdl.handle.net/2268/75163

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