Electronic Speckle Pattern Interferometry at Long Wave Infrared Wavelengths. Scattering Requirements

Vandenrijt, Jean-François; Thizy, Cédric; Alexeenko, Igor; Jorge, Iagoba; Lopez, Ion

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Electronic Speckle Pattern Interferometry at Long Wave Infrared Wavelengths. Scattering Requirements

Vandenrijt, Jean-François; Thizy, Cédric; Alexeenko, Igor et al.

2009 • In Fringe 2009

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https://hdl.handle.net/2268/75163

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Disciplines :

Physics

Author, co-author :

Vandenrijt, Jean-François ; Université de Liège - ULiège > CSL (Centre Spatial de Liège)

Thizy, Cédric ; Université de Liège - ULiège > CSL (Centre Spatial de Liège)

Alexeenko, Igor

Jorge, Iagoba

Lopez, Ion; Université de Liège - ULiège

Language :

English

Title :

Electronic Speckle Pattern Interferometry at Long Wave Infrared Wavelengths. Scattering Requirements

Publication date :

September 2009

Event name :

Fringe 2009

Event organizer :

Institut für Teknische Optik

Event place :

Nürtingen, Germany

Event date :

14-16 September 2009

Audience :

International

Main work title :

Fringe 2009

Publisher :

Springer

Pages :

596-599

Available on ORBi :

since 05 November 2010

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