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Elasto-plastic material parameter identification by inverse methods: sensitivity matrix calculation
Cooreman, Steven; Bouffioux, Chantal; Lecompte, David et al.
2006In Proceedings of the SEM annual conference and exposition 2006
Peer reviewed
 

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Keywords :
inverse methods; FEM; elasto-plastic material properties; sensitivity matrix; heterogeneous fields
Abstract :
[en] Inverse methods offer a powerful tool for the determination of the elasto-plastic material properties. Contrary to standard tests, these methods can deal with heterogeneous stress and strain-fields which have a larger information contents and hence allow the simultaneous identification of several material parameters. Moreover, it is expected that the obtained material parameters are more accurate, since these heterogeneous deformation fields are much closer to those occurring in real (metal) forming operations. The principle of the inverse method for the identification of material parameters presented in this paper is to compare an experimentally measured strain field to that computed by a Finite Element (FE) model. The material parameters in the FE model are iteratively tuned in such a way that both strain fields match each other as close as possible. One of the building blocks in this identification procedure is the updating algorithm for the material parameters in the FE model. The key problem of this updating algorithm is the determination of the sensitivity matrix, which expresses the sensitivities of the strains with respect to the material parameters. This paper presents an analytical method for the calculation of this sensitivity matrix in case of simple tensile tests.
Disciplines :
Materials science & engineering
Author, co-author :
Cooreman, Steven
Bouffioux, Chantal ;  Université de Liège - ULiège > Département Argenco : Secteur MS2F > Département Argenco : Secteur MS2F
Lecompte, David
Debruyne, Dimitri
Sol, Hugo
Vantomme, John
Language :
English
Title :
Elasto-plastic material parameter identification by inverse methods: sensitivity matrix calculation
Publication date :
2006
Event name :
SEM annual conference
Event place :
United States - Missouri
Event date :
June 2006
Audience :
International
Main work title :
Proceedings of the SEM annual conference and exposition 2006
ISBN/EAN :
9780912053950
Peer reviewed :
Peer reviewed
Available on ORBi :
since 10 August 2010

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