Article (Scientific journals)
Study of ZnO sol-gel films: Effect of annealing
Ivanova, T.; Harizanova, A.; Koutzarova, T. et al.
2010In Materials Letters, 64 (10), p. 1147-1149
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Keywords :
Sol-gel; ZnO; Thin films structure
Abstract :
[en] Thin films of zinc oxide were deposited by spin coating method on different substrates. The obtained samples were thermally treated at temperatures from 400 degrees C up to 850 degrees C. The structural study was performed by XRD and FTIR techniques in order to observe the effect of the annealing temperatures. The sol-gel ZnO films showed polycrystalline hexagonal structure. The optical transmittance reached 91% and it diminished with increasing annealing temperatures. (C) 2010 Elsevier B.V. All rights reserved.
Disciplines :
Materials science & engineering
Chemistry
Author, co-author :
Ivanova, T.;  Bulgarian Academy of Science - BAS > Central Laboratory of Solar Energy and New Energy Sources
Harizanova, A.;  Bulgarian Academy of Science - BAS > Central Laboratory of Solar Energy and New Energy Sources
Koutzarova, T.;  Bulgarian Academy of Science - BAS > Institute of Electronics
Vertruyen, Bénédicte  ;  Université de Liège - ULiège > Département de chimie (sciences) > Chimie inorganique structurale
Language :
English
Title :
Study of ZnO sol-gel films: Effect of annealing
Publication date :
2010
Journal title :
Materials Letters
ISSN :
0167-577X
eISSN :
1873-4979
Publisher :
Elsevier Science, Amsterdam, Netherlands
Volume :
64
Issue :
10
Pages :
1147-1149
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 15 July 2010

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