| Reference : Microbeam pull-in voltage topology optimization including material deposition constraint |
| Scientific journals : Article | |||
| Engineering, computing & technology : Electrical & electronics engineering Engineering, computing & technology : Aerospace & aeronautics engineering Engineering, computing & technology : Mechanical engineering Engineering, computing & technology : Multidisciplinary, general & others | |||
| http://hdl.handle.net/2268/6554 | |||
| Microbeam pull-in voltage topology optimization including material deposition constraint | |
| English | |
Lemaire, Etienne [Université de Liège - ULg > Département d'aérospatiale et mécanique > Ingénierie des véhicules terrestres > >] | |
Rochus, Véronique [Université de Liège - ULg > Département d'aérospatiale et mécanique > LTAS - Vibrations et identification des structures >] | |
Golinval, Jean-Claude [Université de Liège - ULg > Département d'aérospatiale et mécanique > LTAS - Vibrations et identification des structures >] | |
Duysinx, Pierre [Université de Liège - ULg > Département d'aérospatiale et mécanique > Ingénierie des véhicules terrestres >] | |
| 2008 | |
| Computer Methods in Applied Mechanics & Engineering | |
| Elsevier Science | |
| 197 | |
| 4040-4050 | |
| International | |
| 0045-7825 | |
| Lausanne | |
| Switzerland | |
| [en] Topology optimization ; Electromechanical coupling ; Pull-in ; Manufacturing constraint | |
| [en] Because of the strong coupling between mechanical and electrical phenomena existing in electromechanical microdevices, some of them experience, above a given driving voltage, an unstable behavior called pull-in effect. The present paper investigates the application of topology optimization to electromechanical microdevices for the purpose of delaying this unstable behavior by maximizing their pull-in voltage. Within the framework of this preliminary study, the pull-in voltage maximization procedure is developed on the basis of electromechanical microbeams reinforcement topology design problem. The proposed sensitivity analysis requires only the knowledge of the microdevice pull-in state and of the first eigenmode of the tangent stiffness matrix. As the pull-in point research is a highly non-linear problem, the analysis is based on a monolithic finite element formulation combined with a normal flow algorithm (homotopy method). An application of the developed method is proposed and the result is compared to the one obtained using a linear compliance optimization. Moreover, as the results provided by the developed method do not comply with manufacturing constraints, a deposition process constraint is added to the optimization problem and its effect on the final design is also tested. | |
| Communauté française de Belgique - CfB | |
| ARC03/08-298 "Modeling, Multiphysics Simulation and Optimization of Coupled Problems - Application to Micro Electro-Mechanical Systems" | |
| http://hdl.handle.net/2268/6554 |
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