Reference : Application Of The Quasi-Static Mode Of The Drop Volume Technique To The Determination O...
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/61178
Application Of The Quasi-Static Mode Of The Drop Volume Technique To The Determination Of Fundamental Surfactant Properties
English
Razafindralambo, Hary mailto [Université de Liège - ULg > Gembloux Agro-Bio Tech > Gembloux Agro-Bio Tech >]
Blecker, Christophe mailto [Université de Liège - ULg > Chimie et bio-industries > Technologie des industries agro-alimentaires >]
Delhaye, Sylvie [> >]
Paquot, Michel mailto [Université de Liège - ULg > Chimie et bio-industries > Chimie biologique industrielle >]
1995
Journal of Colloid and Interface Science
Academic Press
174
2
373-377
Yes (verified by ORBi)
International
0021-9797
1095-7103
Orlando
FL
[en] drop volume techniques; quasi-static mode; surfactant properties; CMC
[en] The quasi-static mode of the drop volume technique has been applied for determining the equilibrium surface tension-concentration (σe-c) curves of ionic (SDS, CTAB) zwitterionic (CHAPS), and nonionic (Triton X-100) surfactants. The experimental values have been fitted in two parts by the best polynomial and straight-line equations. Determination coefficients (R2) higher than 0.98 were achieved for all σe-c curves. The critical micelle concentration (CMC) and surface tension at the CMC have been calculated at the intersection point of the two fitted curves. The results conform with those found in the literature. The polynomial equation derivative at the CMC was used in the Gibbs equation to calculate the maximum surface excess concentration and the corresponding molecular area. The space required per molecule under saturation conditions is in agreement with the surfactant structures. A comparison with the Wilhelmy-plate method was also made. It is concluded that the quasi-static drop volume method provides accurate results and presents many practical advantages.
Researchers ; Professionals ; Students ; General public ; Others
http://hdl.handle.net/2268/61178
10.1006/jcis.1995.1404

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