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Influence of contact resistance on shielding efficiency of shielding gutters for HV cables
Koruglu, Selim; Sergeant, Peter; V Sabariego, Ruth et al.
2010In Proceedings of the 14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
Peer reviewed
 

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Keywords :
magnetic shielding; contact resistance; finite element methods
Abstract :
[en] Shielding of buried three phase high voltage cables can be done by placing the cables in conducting ferromagnetic U- shaped gutters covered by plates. In case of a perfect electrical contact between adjacent gutters and between adjacent cover plates, the induced currents in the shield efficiently reduce the field generated in the vicinity of the cables. However, as a perfect contact cannot be guaranteed, it is useful to quantify the effect of a bad electrical contact on the shielding performance. From 2D FEM, 3D FEM and experiments, it is observed that a bad contact does not influence significantly the shielding if the axial length of the plates is relatively long compared to their other dimensions.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Koruglu, Selim
Sergeant, Peter
V Sabariego, Ruth ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE)
Dang, Quoc Vuong ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE)
Language :
English
Title :
Influence of contact resistance on shielding efficiency of shielding gutters for HV cables
Publication date :
May 2010
Event name :
The 14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
Event organizer :
IEEE
Event place :
Chicago, Illinois, United States
Event date :
May 9-12
Audience :
International
Main work title :
Proceedings of the 14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
ISBN/EAN :
978-1-4244-7061-7
Peer reviewed :
Peer reviewed
Available on ORBi :
since 04 June 2010

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