ORBi: Magnée Raphael - On the Impact of Electron Spectroscopies (Versus Optical Techniques) to Study Organized Organic Layers and Their Interfaces

Reference : On the Impact of Electron Spectroscopies (Versus Optical Techniques) to Study Organized ...


	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Chemistry
	To cite this reference:	http://hdl.handle.net/2268/59167

Title :	On the Impact of Electron Spectroscopies (Versus Optical Techniques) to Study Organized Organic Layers and Their Interfaces
Language :	English
Author, co-author :	Magnée, Raphael [Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > > > >]
	Mekhalif, Zineb [Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > > > >]
	Doneux, Catherine [Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > > > >]
	Duwez, Anne-Sophie [Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP. Present address: University of Liège > > > >]
	Grégoire, Chantal [Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > > > >]
	Riga, Joseph [Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > > > >]
	Delhalle, Joseph [Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > > > >]
	Pireaux, Jean-Jacques [Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > > > >]
Publication date :	1998
Journal title :	Journal of Electron Spectroscopy & Related Phenomena
Publisher :	Elsevier Science
Volume :	88-91
Pages :	855-860
Audience :	International
ISSN :	0368-2048
City :	Amsterdam
Country :	The Netherlands
Abstract :	[en] When preparing and characterizing ordered organic layers, knowledge of the structure of the ultra-thin fihns is often missing or difficult to gather. For different self-assembled layers of the thiol and carboxylic acid families, we show that this valuable type of information is obtainable with X-ray photoelectron spectroscopy (XPS) and high-resolution electron energyqoss spectroscopy (HREELS). Indeed, information on the film order and superficial composition is available through analysis of the core-level peak positions and widths (in XPS), and through study of the elastic peak width and angular distribution and analysis of the material excitation function (in HREELS). However, [or some insight into the crystallinity of the layer and intermolecular interactions, infrared spectroscopy in the grazing-angle absorption--reflection mode (IRASI appears to be complementary
Target :	Researchers
Permalink :	http://hdl.handle.net/2268/59167

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