Reference : Portable x-ray fluorescence spectrometer for coating thickness measurement
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/4790
Portable x-ray fluorescence spectrometer for coating thickness measurement
English
Carapelle, Alain mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Fleury-Frenette, Karl mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Collette, Jean-Paul [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Garnir, Henri-Pierre mailto [Université de Liège - ULg > Département de physique > Physique nucléaire, atomique et spectroscopie >]
Harlet, Philippe [> > > >]
2007
Review of Scientific Instruments
American Institute of Physics
78
12
Yes
International
0034-6748
1089-7623
New York
NY
[en] XRF ; coating ; thickness
[en] A handheld x-ray spectrometer has been realized and tested. The purpose of the device is to measure the thickness of coated samples in the range of 1-1500 nm in an industrial environment. Accuracy of similar to 3% has been achieved in this range with a measurement time of 1 min. Automated software has been implemented to allow utilization by a nonspecialist operator. An automated calibration procedure, based on measurements of reference samples, is used. (C) 2007 American Institute of Physics.
http://hdl.handle.net/2268/4790
10.1063/1.2822613

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