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Bulk and grain strain measurements in sandstone by image analysis
VanBrabant, Yves; Lebrun, Vincent; Nivart, Jean-François et al.
1999In Proceedings of GeoVision 99
Peer reviewed
 

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Keywords :
image analysis; polarised light microscopy; strain analysis
Disciplines :
Geological, petroleum & mining engineering
Author, co-author :
VanBrabant, Yves
Lebrun, Vincent
Nivart, Jean-François
Jongmans, Denis
Pirard, Eric  ;  Université de Liège - ULiège > Département Argenco : Secteur GeMMe > Géoressources minérales & Imagerie géologique
Language :
English
Title :
Bulk and grain strain measurements in sandstone by image analysis
Publication date :
1999
Event place :
Liege, Belgium
Audience :
International
Main work title :
Proceedings of GeoVision 99
Pages :
249-252
Peer reviewed :
Peer reviewed
Available on ORBi :
since 03 March 2010

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