Reference : Correction of Thin Shell Finite Element Magnetic Models via a Subproblem Method
Scientific congresses and symposiums : Paper published in a book
Engineering, computing & technology : Electrical & electronics engineering
http://hdl.handle.net/2268/38653
Correction of Thin Shell Finite Element Magnetic Models via a Subproblem Method
English
Dular, Patrick mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
Dang, Quoc Vuong [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
V Sabariego, Ruth mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
Krähenbühl, Laurent [Université de Lyon, École Centrale de Lyon - ECL, France > Laboratoire Ampère (CNRS UMR5005) > > >]
Geuzaine, Christophe mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
May-2010
Proceedings of the 14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
Yes
International
978-1-4244-7061-7
14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
May 9-12, 2010
IEEE
Chicago, Illinois
USA
[en] A sub-problem finite element method is developed for correcting the inaccuracies near edges and corners inherent to thin shell models, for both magnetostatic and magnetodynamic problems. A thin shell solution, supported by a simplified mesh near the thin structures, serves as a source of a correction problem with the actual volumic thin regions alone in a homogeneous medium, concentrating the meshing effort on the thin regions only. Improvements of local fields are efficiently achieved and allow accurate force and loss calculations.
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/38653
10.1109/CEFC.2010.5481355
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5481355&isnumber=5480326

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