Reference : Analyzing and Reducing Error in 2-D Frequency Domain Homogenization of Windings for R...
Scientific congresses and symposiums : Paper published in a book
Engineering, computing & technology : Electrical & electronics engineering
http://hdl.handle.net/2268/38648
Analyzing and Reducing Error in 2-D Frequency Domain Homogenization of Windings for R, L Parameters FE Computation
English
De Grève, Zacharie [Faculté Polytechnique de Mons - FPMs > > > >]
Deblecker, Olivier [Faculté Polytechnique de Mons - FPMs > > > >]
Lobry, Jacques [Faculté Polytechnique de Mons - FPMs > > > > > >]
V Sabariego, Ruth mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
Dular, Patrick mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
Geuzaine, Christophe mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
May-2010
Proceedings of the 14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
Yes
International
978-1-4244-7061-7
Chicago
USA
14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
May 9-12, 2010
IEEE
Chicago, Illinois
USA
[en] In this work, the error made by frequency domain homogenization of windings in 2-D
magnetodynamics is quantified. To that end, the homogenized fields are combined with the analytical
solutions (a) of eddy currents flowing in a circular conductor placed in a uniform alternating magnetic
induction (proximity effect) and (b) of current density in conductors with non-zero net current (skin
effect). They are then compared to the fields from the fine model, taken as reference. It is shown that
error on resistance can reach 10\% at high frequencies for magnetic components with a limited number of
turns. Procedures to improve winding R, L parameters estimation from homogenized solution are introduced.
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/38648
10.1109/CEFC.2010.5481385
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5481385&isnumber=5480326

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