ORBi: Vion Alexandre - A model reduction algorithm for solving multiple scattering problems using iterative methods

Reference : A model reduction algorithm for solving multiple scattering problems using iterative met...


	Document type :	Scientific congresses and symposiums : Paper published in a book
	Discipline(s) :	Engineering, computing & technology : Electrical & electronics engineering
	To cite this reference:	http://hdl.handle.net/2268/38587

Title :	A model reduction algorithm for solving multiple scattering problems using iterative methods
Language :	English
Author, co-author :	Vion, Alexandre [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
	V Sabariego, Ruth [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
	Geuzaine, Christophe [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
Publication date :	May-2010
Main document title :	Proceedings of the 14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
Audience :	International
ISBN :	978-1-4244-7061-7
City :	Chicago
Country :	USA
Event name :	14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
Event date :	May 9-12, 2010
Event organizer :	IEEE
Event place (city) :	Chicago, Illinois
Event country :	USA
Abstract :	[en] This paper presents a new method for solving scattering problems by multiple objects. A model reduction algorithm based on the Macro Basis Functions (MBFs) method is used to find an approximate solution within a subspace of solutions, that are the solutions of several single scattering subproblems. Different iterative methods for the generation of the MBFs are compared. The whole process relies on a finite element approach and is applied to convex obstacles scattering.
Target :	Researchers ; Professionals ; Students
Permalink :	http://hdl.handle.net/2268/38587
DOI :	10.1109/CEFC.2010.5481483
Other URL :	http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5481483&isnumber=5480326

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