Reference : 3{sigma} hard sample of XMDS survey (Tajer+, 2007)
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Physical, chemical, mathematical & earth Sciences : Space science, astronomy & astrophysics
http://hdl.handle.net/2268/32443
3{sigma} hard sample of XMDS survey (Tajer+, 2007)
English
Tajer, M. [> > > >]
Polletta, M. [> > > >]
Chiappetti, L. [> > > >]
Maraschi, L. [> > > >]
Trinchieri, G. [> > > >]
Maccagni, D. [> > > >]
Andreon, S. [> > > >]
Garcet, O. [> > > >]
Surdej, Jean mailto [Université de Liège - ULg > Département d'astrophys., géophysique et océanographie (AGO) > Astroph. extragalactique et observations spatiales (AEOS) >]
Pierre, M. [> > > >]
Le Fevre, O. [> > > >]
Franceschini, A. [> > > >]
Lonsdale, C. J. [> > > >]
Surace, J. A. [> > > >]
Shupe, D. L. [> > > >]
Fang, F. [> > > >]
Rowan-Robinson, M. [> > > >]
Smith, H. E. [> > > >]
Tresse, L. [> > > >]
1-Aug-2007
[en] Surveys ; Active gal. nuclei ; X-ray sources ; Infrared sources ; Redshifts ; Photometry: UBVRI
[en] Our goal is to probe the populations of obscured and unobscured AGN investigating their optical-IR and X-ray properties as a function of X-ray flux, luminosity and redshift within a hard X-ray selected sample with wide multiwavelength coverage. We selected a sample of 136 X-ray sources detected at a significance of >=3{sigma} in the 2-10keV band (F[SUB]2-10[/SUB]>~10[SUP]-14[/SUP]erg/cm[SUP]2[/SUP]/s) in a ~1deg[SUP]2[/SUP] area in the XMM Medium Deep Survey (XMDS, Cat. ). The XMDS area is covered with optical photometry from the VVDS and CFHTLS surveys and infrared Spitzer data from the SWIRE survey. Based on the X-ray luminosity and X-ray to optical ratio, 132 sources are likely AGN, of which 122 have unambiguous optical - IR identification. The observed optical and IR spectral energy distributions of all identified sources are fitted with AGN/galaxy templates in order to classify them and compute photometric redshifts. X-ray spectral analysis is performed individually for sources with a sufficient number of counts and using a stacking technique for subsamples of sources at different flux levels. Hardness ratios are used to estimate X-ray absorption in individual weak sources. (1 data file).
Researchers ; Professionals
http://hdl.handle.net/2268/32443
http://adsabs.harvard.edu/abs/2007yCat..34670073T
http://vizier.cfa.harvard.edu/viz-bin/VizieR?-source=J/A+A/467/73

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