Reference : Unusual Applicatio Of Ion Beam Analysis For The Study Of Surface Layers On Materials ...
Scientific congresses and symposiums : Paper published in a book
Physical, chemical, mathematical & earth Sciences : Multidisciplinary, general & others
http://hdl.handle.net/2268/28553
Unusual Applicatio Of Ion Beam Analysis For The Study Of Surface Layers On Materials Relevant to Cultural Heritage
English
Mathis, François mailto [Université de Liège - ULg > > Centre européen en archéométrie - Physique nucléaire, atomique et spectroscopie >]
Salomon, Joseph [>Ministère de la Culture et de la Communication > > >Centre de Recherche et de Restauration des Musées de France > > >]
Trocellier, Patrick [Commissariat à l'Energie Atomique (Saclay) - CEA > > >Service de Recherche en Métallurgie Physique > > >]
Aucouturier, Marc [Centre National de la Recherche Scientifique - CNRS > > >Laboratoire du Centre de Recherche et de Restauration des Musées de France - UMR171 > > >]
2006
The physics of Ionized Gases
Hadzievski, Ljupco
Marinkovic, Bratislav
Simonovic, Nenad
American Institute of Physics
AIP Conference Proceedings 876
191-200
Yes
International
978-0-7354-0377-2
New York
USA
23rd Summer Scool and internationnal symposium on the Physic of Ionized Gases
Kopaonik
Serbia
[en] IBA ; PIXE ; RBS ; External beam mode ; Archaeometry ; Bronze
Researchers ; Professionals
http://hdl.handle.net/2268/28553
978-0-7354-0377-2

File(s) associated to this reference

Fulltext file(s):

FileCommentaryVersionSizeAccess
Restricted access
SPIG article Mathis.pdfAuthor postprint638.79 kBRequest copy

Bookmark and Share SFX Query

All documents in ORBi are protected by a user license.