ORBi: Rochus Véronique - Electrostatic Simulation using XFEM for Conductor and Dielectric Interfaces

Reference : Electrostatic Simulation using XFEM for Conductor and Dielectric Interfaces


	Document type :	Scientific journals : Article
	Discipline(s) :	Engineering, computing & technology : Aerospace & aeronautics engineering
	To cite this reference:	http://hdl.handle.net/2268/23538

Title :	Electrostatic Simulation using XFEM for Conductor and Dielectric Interfaces
Language :	English
Author, co-author :	Rochus, Véronique [Delft University of Technology > Faculty 3mE, Dpt. of Precision and Microsystems Engineering > Engineering Dynamics > >]
	Rixen, Daniel [Delft University of Technology > Faculty 3mE, Dpt. of Precision and Microsystems Engineering > Engineering Dynamics > >]
	Van Miegroet, Laurent [Université de Liège - ULg > Département d'aérospatiale et mécanique > Ingénierie des véhicules terrestres >]
	Duysinx, Pierre [Université de Liège - ULg > Département d'aérospatiale et mécanique > Ingénierie des véhicules terrestres >]
Publication date :	2011
Journal title :	International Journal for Numerical Methods in Engineering
Publisher :	John Wiley & Sons, Inc
Volume :	85
Issue/season :	10
Pages :	1207–1226
Audience :	International
ISSN :	0029-5981
City :	Chichester
Country :	United Kingdom
Keywords :	[en] Extended Finite Elements ; Dirichlet Boundary Conditions ; Electrostatic Forces
Abstract :	[en] ManyMicro-Electro-Mechanical Systems (e.g. RF-switches, micro-resonators and micro-rotors) involve mechanical structures moving in an electrostatic field. For this type of problems, it is required to evaluate accurately the electrostatic forces acting on the devices. Extended Finite Element (X-FEM) approaches can easily handle moving boundaries and interfaces in the electrostatic domain and seem therefore very suitable to model Micro-Electro-Mechanical Systems. In this study we investigate different X-FEM techniques to solve the electrostatic problem when the electrostatic domain is bounded by a conducting material. Preliminary studies in one-dimension have shown that one can obtain good results in the computation of electrostatic potential using X-FEM. In this paper the extension of these preliminary studies to 2D problem is presented. In particular a new type of enrichment functions is proposed in order to treat accurately Dirichlet boundary conditions on the interface.
Funders :	Fonds de la Recherche Scientifique (Communauté française de Belgique) - F.R.S.-FNRS
Permalink :	http://hdl.handle.net/2268/23538
DOI :	10.1002/nme.2998

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