Reference : Electrostatic Simulation using XFEM for Conductor and Dielectric Interfaces
Scientific journals : Article
Engineering, computing & technology : Aerospace & aeronautics engineering
http://hdl.handle.net/2268/23538
Electrostatic Simulation using XFEM for Conductor and Dielectric Interfaces
English
Rochus, Véronique mailto [Delft University of Technology > Faculty 3mE, Dpt. of Precision and Microsystems Engineering > Engineering Dynamics > >]
Rixen, Daniel mailto [Delft University of Technology > Faculty 3mE, Dpt. of Precision and Microsystems Engineering > Engineering Dynamics > >]
Van Miegroet, Laurent mailto [Université de Liège - ULg > Département d'aérospatiale et mécanique > Ingénierie des véhicules terrestres >]
Duysinx, Pierre mailto [Université de Liège - ULg > Département d'aérospatiale et mécanique > Ingénierie des véhicules terrestres >]
2011
International Journal for Numerical Methods in Engineering
John Wiley & Sons, Inc
85
10
1207–1226
Yes (verified by ORBi)
International
0029-5981
Chichester
United Kingdom
[en] Extended Finite Elements ; Dirichlet Boundary Conditions ; Electrostatic Forces
[en] ManyMicro-Electro-Mechanical Systems (e.g. RF-switches, micro-resonators and micro-rotors) involve
mechanical structures moving in an electrostatic field. For this type of problems, it is required to
evaluate accurately the electrostatic forces acting on the devices. Extended Finite Element (X-FEM)
approaches can easily handle moving boundaries and interfaces in the electrostatic domain and seem
therefore very suitable to model Micro-Electro-Mechanical Systems. In this study we investigate
different X-FEM techniques to solve the electrostatic problem when the electrostatic domain is
bounded by a conducting material. Preliminary studies in one-dimension have shown that one can
obtain good results in the computation of electrostatic potential using X-FEM. In this paper the
extension of these preliminary studies to 2D problem is presented. In particular a new type of
enrichment functions is proposed in order to treat accurately Dirichlet boundary conditions on the
interface.
Fonds de la Recherche Scientifique (Communauté française de Belgique) - F.R.S.-FNRS
http://hdl.handle.net/2268/23538
10.1002/nme.2998

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