Article (Scientific journals)
Numerical treatment of rounded and sharp corners in the modeling of 2D electrostatic fields
Krähenbühl, Laurent; Buret, François; Perrussel, Ronan et al.
2011In Journal of Microwaves, Optoelectronics and Electromagnetic Applications, 10 (1), p. 66-81
Peer reviewed
 

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Keywords :
Finite element method; geometric singularity; asymptotic expansion; rounded corner
Abstract :
[en] This work deals with numerical techniques to compute electrostatic fields in devices with rounded corners in 2D situations. The approach leads to the solution of two problems: one on the device where rounded corners are replaced by sharp corners and the other on an unbounded domain representing the shape of the rounded corner after an appropriate rescaling. Both problems are solved using different techniques and numerical results are provided to assess the effciency and the accuracy of the techniques.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Krähenbühl, Laurent;  Université de Lyon, Ecole Centrale de Lyon > Laboratoire Ampère
Buret, François;  Université de Lyon, Ecole Centrale de Lyon > Laboratoire Ampère
Perrussel, Ronan;  Université de Lyon, Ecole Centrale de Lyon > Laboratoire Ampère
Voyer, Damien;  Université de Lyon, Ecole Centrale de Lyon > Laboratoire Ampère
Dular, Patrick ;  Université de Liège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE)
Péron, Victor;  Université de Bordeaux1 > Institut de Mathématiques de Bordeaux
Poignard, Clair;  Université de Bordeaux1 > Institut de Mathématiques de Bordeaux
Language :
English
Title :
Numerical treatment of rounded and sharp corners in the modeling of 2D electrostatic fields
Publication date :
June 2011
Journal title :
Journal of Microwaves, Optoelectronics and Electromagnetic Applications
ISSN :
2179-1074
Publisher :
Brazilian Microwave and Optoelectronics Society, Brazil
Special issue title :
SELECT PAPERS FROM MOMAG 2010
Volume :
10
Issue :
1
Pages :
66-81
Peer reviewed :
Peer reviewed
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