Article (Scientific journals)
A scanning Hall probe microscope for high resolution, large area, variable height magnetic field imaging
Shaw, Gorky; Kramer, R. B. G.; Dempsey, N. M. et al.
2016In Review of Scientific Instruments, 87 (11)
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Abstract :
[en] We present a scanning Hall probe microscope operating in ambient conditions. One of the unique features of this microscope is the use of the same stepper motors for both sample positioning as well as scanning, which makes it possible to have a large scan range (few mm) in the x and y directions, with a scan resolution of 0.1 μm. Protocols have been implemented to enable scanning at different heights from the sample surface. The z range is 35 mm. Microstructured Hall probes of size 1-5 μm have been developed. A minimum probe-sample distance <2 μm has been obtained by the combination of new Hall probes and probe-sample distance regulation using a tuning fork based force detection technique. The system is also capable of recording local B(z) profiles. We discuss the application of the microscope for the study of micro-magnet arrays being developed for applications in micro-systems.
Disciplines :
Physics
Author, co-author :
Shaw, Gorky ;  Université de Liège > Département de physique > Physique expérimentale des matériaux nanostructurés
Kramer, R. B. G.
Dempsey, N. M.
Hasselbach, K.
Language :
English
Title :
A scanning Hall probe microscope for high resolution, large area, variable height magnetic field imaging
Publication date :
November 2016
Journal title :
Review of Scientific Instruments
ISSN :
0034-6748
eISSN :
1089-7623
Publisher :
American Institute of Physics, New York, United States - New York
Volume :
87
Issue :
11
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 15 November 2016

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