Reference : Magnetic texturing of bulk samples of the superconductor Bi2Sr2Ca0.8Dy0.2Cu2O8-y
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/19973
Magnetic texturing of bulk samples of the superconductor Bi2Sr2Ca0.8Dy0.2Cu2O8-y
English
Stassen, Sophie [> > > >]
Rulmont, André [Université de Liège - ULg > Département de chimie (sciences) > Département de chimie (sciences) >]
Vanderbemden, Philippe mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Capteurs et systèmes de mesures électriques >]
Vanderschueren, André [> > > >]
Gabelica, Z. [> > > >]
Cloots, Rudi [Université de Liège - ULg > Département de chimie (sciences) > Chimie inorganique structurale - Doyen de la Faculté des Sciences >]
Ausloos, Marcel [Université de Liège - ULg > Département de physique > Physique statistique appliquée et des matériaux - S.U.P.R.A.S. >]
1996
Journal of Applied Physics
American Institute of Physics
79
1
553-555
Yes (verified by ORBi)
International
0021-8979
Melville
NY
[en] magnetic texturing ; high-Tc superconductors ; AC susceptibility
[en] The texturing process of Bi-Sr-Ca(Dy)-Cu-O (2212) is optimized by sintering under a magnetic field. The precursor crystalline powder is melted and grown under a 1.2 T magnetic field. Textured samples are characterized by x-ray diffraction, scanning electron microscopy, electrical resistivity, and magnetic susceptibility. (C) 1996 American Institute of Physics.
Services Universitaires Pour la Recherche et les Applications Technologiques de Matériaux Électro-Céramiques, Composites, Supraconducteurs - SUPRATECS
Fonds de la Recherche Scientifique (Communauté française de Belgique) - F.R.S.-FNRS ; Services Fédéraux des Affaires Scientifiques, Techniques et Culturelles - SSTC
Researchers ; Professionals
http://hdl.handle.net/2268/19973
10.1063/1.360864
http://link.aip.org/link/?JAPIAU/79/553/1
Copyright (1996) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
The following article appeared in J. Appl. Phys. 79, 553 (1996) and may be found at http://link.aip.org/link/?JAPIAU/79/553/1.

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