Vibration mode shapes visualization in industrial environment by real-time time-averaged phase-stepped electronic speckle pattern interferometry at 10.6 μm and shearography at 532 nm
Shearography; Long wavelength infrared; Interferometry; Speckle pattern
Abstract :
[en] We present our investigations on two interferometric methods suitable for industrial conditions dedicated to the visualization of vibration modes of aeronautic blades. First, we consider long-wave infrared (LWIR) electronic speckle pattern interferometry (ESPI). The use of long wavelength allows measuring larger amplitudes of vibrations compared with what can be achieved with visible light. Also longer wavelengths allow lower sensitivity to external perturbations. Second, shearography at 532 nm is used as an alternative to LWIR ESPI. Both methods are used in time-averaged mode with the use of phase-stepping. This allows transforming Bessel fringes, typical to time averaging, into phase values that provide higher contrast and improve the visualization of vibration mode shapes. Laboratory experimental results with both techniques allowed comparison of techniques, leading to selection of shearography. Finally a vibration test on electrodynamic shaker is performed in an industrial environment and mode shapes are obtained with good quality by shearography.
Research center :
CSL - Centre Spatial de Liège - ULiège
Disciplines :
Physics
Author, co-author :
Languy, Fabian ; Université de Liège > CSL (Centre Spatial de Liège)
Thizy, Cédric ; Université de Liège > CSL (Centre Spatial de Liège)
Rochet, Jonathan
Loffet, Christophe
Simon, Daniel
Georges, Marc ; Université de Liège > CSL (Centre Spatial de Liège)
Language :
English
Title :
Vibration mode shapes visualization in industrial environment by real-time time-averaged phase-stepped electronic speckle pattern interferometry at 10.6 μm and shearography at 532 nm
Publication date :
01 June 2016
Journal title :
Optical Engineering
ISSN :
0091-3286
eISSN :
1560-2303
Publisher :
International Society of Optical Engineering, Bellingham, United States - Washington
Special issue title :
Special Section on Speckle-Based Metrology
Volume :
55
Issue :
12
Pages :
121704
Peer reviewed :
Peer Reviewed verified by ORBi
Name of the research project :
A.O.C.
Funders :
Service public de Wallonie : Direction générale opérationnelle de l'économie, de l'emploi et de la recherche - DG06
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