Article (Scientific journals)
Wavelet characterization of coarsening during unstable MBE growth
Moktadir, Zakaria; Kraft, Michael
2005In Microelectronics Journal, 56 (3-6)
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Abstract :
[en] We present a wavelet analysis of coarsening of mounds during molecular beam epitaxy. The advantage in using wavelets over Fourier analysis is that one can track the coarsening process in both, location (direct space) and frequency (or scale) space at the same time. The wavelets concise scale decomposition allows the discrimination of the coarsening process, i.e. tracking coarsening at different scales.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Moktadir, Zakaria
Kraft, Michael ;  Université de Liège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
Language :
English
Title :
Wavelet characterization of coarsening during unstable MBE growth
Publication date :
2005
Journal title :
Microelectronics Journal
ISSN :
0026-2692
Publisher :
Elsevier Science
Volume :
56
Issue :
3-6
Peer reviewed :
Peer Reviewed verified by ORBi
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since 02 June 2016

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