Design, fabrication and testing of tunable microcavities for atom chips

Srinivasan, P; Gollasch, CO; Kraft, Michael

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Design, fabrication and testing of tunable microcavities for atom chips

Srinivasan, P; Gollasch, CO; Kraft, Michael

2009 • In Proc. Eurosensors XXIII Conference

Peer reviewed

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https://hdl.handle.net/2268/187401

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Disciplines :

Electrical & electronics engineering

Author, co-author :

Srinivasan, P

Gollasch, CO

Kraft, Michael ; Université de Liège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

Design, fabrication and testing of tunable microcavities for atom chips

Publication date :

2009

Event name :

Proc. Eurosensors XXIII Conference

Event place :

Lausanne, Switzerland

Event date :

septembre 2009

By request :

Yes

Audience :

International

Main work title :

Proc. Eurosensors XXIII Conference

Pages :

pp159

Peer reviewed :

Peer reviewed

Available on ORBi :

since 29 October 2015

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