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Comparison between thermographic and holographic techniques for nondestructive testing of composites: similarities, differences and potential cross-fertilization
Georges, Marc
2015In Mendoza Santoyo, Fernando (Ed.) SPECKLE 2015: VI International Conference on Speckle Metrology
 

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Keywords :
Nondestructive testing; thermography; holographic interferometry; speckle interferometry; shearography; defect detection; composite materials
Abstract :
[en] Thermography and different variants of holography (holographic interferometry, speckle interferometry, shearography) are full-field non-contact techniques which are used in nondestructive testing applications. In particular they are attractive for damage detection in composite materials compared to other methods measuring in one point and which require scanning and contact with the samples, like ultrasounds. Currently thermography is a step forward compared to holographic techniques for this application. Indeed it is easier to interpret. Many thermography configurations and variants exist, from exciting sources to post-processing. Such a variety exists also among the holographic techniques but to a less extent. We will see how these techniques can share some aspects and what distinguish them. Also the complementarity of both will be addressed and how to combine them. At last we will discuss how processing developed for thermography can benefit to holography and vice-versa, specifically in the domain of composite materials.
Disciplines :
Physics
Author, co-author :
Georges, Marc ;  Université de Liège > CSL (Centre Spatial de Liège)
Language :
English
Title :
Comparison between thermographic and holographic techniques for nondestructive testing of composites: similarities, differences and potential cross-fertilization
Publication date :
August 2015
Event name :
SPECKLE 2015: VI International Conference on Speckle Metrology
Event place :
Guanajuato, Mexico
Event date :
24-26 Aug 2015
By request :
Yes
Audience :
International
Main work title :
SPECKLE 2015: VI International Conference on Speckle Metrology
Author, co-author :
Mendoza Santoyo, Fernando
Publisher :
SPIE, Bellingham, WA, United States
Collection name :
Proceedings of SPIE, Vol. 9660
Available on ORBi :
since 04 September 2015

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