Wavelets Characterization of coarsing during unstable MBE growth

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Paper published in a book (Scientific congresses and symposiums)

Moktadir, Z; Kraft, Michael

2004 • In Proceedings of "Low Dimensional Semiconductor Devices Conference, Cancun, décembre 2004"

Peer reviewed

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https://hdl.handle.net/2268/183428

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Disciplines :

Electrical & electronics engineering

Author, co-author :

Moktadir, Z

Kraft, Michael ; Université de Liège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

Wavelets Characterization of coarsing during unstable MBE growth

Publication date :

December 2004

Event name :

Low Dimensional Semiconductor Devices Conference

Event place :

Cancun, Mexico

Event date :

Décembre 2004

Audience :

International

Main work title :

Proceedings of "Low Dimensional Semiconductor Devices Conference, Cancun, décembre 2004"

Peer reviewed :

Peer reviewed

Available on ORBi :

since 30 June 2015

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