Reference : Mass Spectrometric Study of Dissociative Attachment in Diatomic Molecules. II. NO and O2.
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Chemistry
http://hdl.handle.net/2268/182
Mass Spectrometric Study of Dissociative Attachment in Diatomic Molecules. II. NO and O2.
English
[fr] Etude de l'attachement électronique dissociatif dans les molécules biatomiques par spectrométrie de masse: II. NO et O2.
Locht, Robert mailto [Université de Liège - ULg > Departement de Chimie (Faculté des sciences) > Laboratoire de Dynamique Moléculaire (Sciences) > >]
Momigny, Jacques [Université de Liège - ULg > Faculté des Sciences > Laboratoire des Etats Ionisés > >]
1970
International Journal of Mass Spectrometry and Ion Physics
Elsevier
4
379-391
Yes
International
0020-7381
1873-3034
Amsterdam
The Netherlands
[en] Mass Spectrometry ; Dissociative Electron Attachment ; Electron Impact ; Diatomic Molecules: NO, O2
[en] The DA processes of O- ions in NO and O2 are investigated using a 60° sector field mass spectrometer. In NO O- appears at (7.43+/-0.2) eV and the analysis of the DA curve indicates the probable existence of two other processes at 8.1 eV and 9.0 eV. In O2 only one process is observed at (3.45+/-0.3) eV. For both molecules an attempt is made to establish the shape of the potential energy curve of the electronic states of the transient negative molecular species involved.
Laboratoire de Dynamique Moléculaire
FRFC ; Fonds de la Recherche Scientifique (Communauté française de Belgique) - F.R.S.-FNRS
Researchers
http://hdl.handle.net/2268/182
- Printed version of reprint available on request
- Version imprimée du tiré-à-part disponible sur demande

File(s) associated to this reference

Fulltext file(s):

FileCommentaryVersionSizeAccess
Open access
IJMSIP4(1970)379.pdfAuthor postprint234.94 kBView/Open

Bookmark and Share SFX Query

All documents in ORBi are protected by a user license.