Reference : An iterative finite element perturbation method for computing electrostatic field distor...
Scientific journals : Article
Engineering, computing & technology : Electrical & electronics engineering
http://hdl.handle.net/2268/1767
An iterative finite element perturbation method for computing electrostatic field distortions
English
Boutaayamou, Mohamed mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
V Sabariego, Ruth mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
Dular, Patrick mailto [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE) >]
Jun-2008
IEEE Transactions on Magnetics
IEEE
44
6
746-749
Yes (verified by ORBi)
International
0018-9464
Piscataway
NJ
[en] electrostatics ; finite element analysis ; iterative methods
[fr] perturbation theory
[en] A finite element perturbation method is developed for computing electrostatic field distortions and the ensuing charges and forces on moving conductive regions subjected to fixed potentials. It is based on the subsequent solution of an unperturbed problem in a complete domain, where conductive regions have been extracted, and of perturbation problems in subdomains restricted to the surroundings of the added conductive regions. The solution of the unperturbed problem serves as source (with a very reduced support) for the perturbation subproblems. For every new position of the conductors, the solution of the unperturbed problem does not vary and is thus reused; only the perturbation subproblems have to be solved. Further, this approach allows for the use of independent and well-adapted meshes. An iterative procedure is required if the conductive regions are close to the sources.
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/1767
10.1109/TMAG.2007.916146
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4526810

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