[en] A versatile high pressure X-ray sample cell has been developed for conducting in situ time-resolved X-ray scattering experiments in the pressure and temperature regime required (pressures up to 210 bars and temperatures up to 120 °C) for chemical reactions in supercritical fluids. The large exit opening angle of the cell allows simultaneous performance of SAXS-WAXS experiments. Diamond windows are used in order to benefit from the combination of maximum strength, minimal X-ray absorption and chemical inertia. The sample cell can also be utilised for X-ray spectroscopy experiments over a wide range of photon energies. Results of the online synthesis of a block copolymer, poly(methyl methacrylate-block-poly(benzyl methacrylate), by Reversible Addition-Fragmentation Chain Transfer (RAFT) in a supercritical CO2 dispersion polymerisation will be discussed. The contribution of the density fluctuations, as function of temperature, to the X-ray scattering signal has been quantified in order to allow appropriate background subtractions
Disciplines :
Physics
Author, co-author :
Hermida-Merino, Daniel
Portale, Giuseppe
Fields, Peter
Wilson, Richard
Basset, Simon
Jennings, James
Dellar, Martin
Gommes, Cédric ; Université de Liège - ULiège > Département de chimie appliquée > Département de chimie appliquée
Howdle, Steven
Bras, Wim
Vrolijk, Benno
Language :
English
Title :
A high pressure cell for supercritical CO2 on-line chemical reactions studied with x-ray techniques
Publication date :
2014
Journal title :
Review of Scientific Instruments
ISSN :
0034-6748
eISSN :
1089-7623
Publisher :
American Institute of Physics, New York, United States - New York
M. Cakmak, A. Teitge, H. G. Zachmann, and J. L. White, J. Polym. Sci., Part B: Polym. Phys. 31, 371-381 (1993). 10.1002/polb.1993.090310316
M. J. Elwell, S. Mortimer, A. J. Ryan, and W. Bras, Nucl. Instrum. Methods Phys. Res., Sect. B 97, 261-264 (1995). 10.1016/0168-583X(94)00742-X
W. Bras and A. J. Ryan, Adv. Colloid Interface Sci. 75, 1-43 (1998). 10.1016/S0001-8686(97)00032-8
D. Cavallo, G. Portale, L. Balzano, F. Azzurri, W. Bras, G. W. Peters, and G. C. Alfonso, Macromolecules 43, 10208-10212 (2010). 10.1021/ma1022499
L. Balzano, S. Rastogi, and G. Peters, Macromolecules 44, 2926-2933 (2011). 10.1021/ma102662p
G. Portale, D. Cavallo, G. C. Alfonso, D. Hermida-Merino, M. van Drongelen, L. Balzano, G. W. M. Peters, J. G. P. Goossens, and W. Bras, J. Appl. Crystallogr. 46, 1681-1689 (2013). 10.1107/S0021889813027076
J. M. Samon, J. M. Schultz, J. Wu, B. S. Hsiao, F. Yeh, and R. Kolb, J. Polym. Sci., Part B: Polym. Phys. 37, 1277-1287 (1999). 10.1002/(SICI)1099-0488(19990615)37:12<1277::AID-POLB8>3.0.CO;2-X
J. M. Samon, J. M. Schultz, and B. S. Hsiao, Polymer 41, 2169-2182 (2000). 10.1016/S0032-3861(99)00378-X
L. Fernandez-Ballester, T. Gough, F. Meneau, W. Bras, F. Ania, J. C. Francisco and J. A. Kornfield, J. Synchrotron Radiat. 15, 185-190 (2008). 10.1107/S0909049508002598
V. Martis, S. Nikitenko, S. Sen, G. Sankar, W. van Beek, Y. Filinchuk, I. Snigireva, and W. Bras, Cryst. Growth Des. 11, 2858-2865 (2011). 10.1021/cg200004y
D. Tatchev, A. Hoell, M. Eichelbaum, and K. Rademann, Phys. Rev. Lett. 106, 085702 (2011). 10.1103/PhysRevLett.106.085702
G. D. Wignall, J. Phys.: Condens. Matter 11, R157-R177 (1999). 10.1088/0953-8984/11/15/006
T. Sato, M. Sugiyama, K. Itoh, K. Mori, T. Fukunaga, M. Misawa, T. Otomo, and S. Takata, Phys. Rev. E: Stat., Nonlinear, Soft Matter Phys. 78, 051503 (2008). 10.1103/PhysRevE.78.051503
J. L. Kendall, D. A. Canelas, J. L. Young, and J. M. DeSimone, Chem. Rev. 99, 543-564 (1999). 10.1021/cr9700336
K. J. Thurecht and S. M. Howdle, Aust. J. Chem. 62, 786-789 (2009). 10.1071/CH09081
F. Jordan, A. Naylor, C. A. Kelly, S. M. Howdle, A. Lewis, and L. Illum, J. Controlled Release 141, 153-160 (2010). 10.1016/j.jconrel.2009.09.013
S. M. Howdle, M. S. Watson, M. J. Whitaker, V. K. Popov, M. C. Davies, F. S. Mandel, J. D. Wang, and K. M. Shakesheff, Chem. Commun. 1, 109-110 (2001). 10.1039/B008188O
J. Jennings, M. Beija, A. P. Richez, S. D. Cooper, P. E. Mignot, K. J. Thurecht, K. S. Jack, and S. M. Howdle, J. Am. Chem. Soc. 134, 4772-4781 (2012). 10.1021/ja210577h
J. Jennings, M. Beija, J. T. Kennon, H. Willcock, R. K. O'Reilly, S. Rimmer, and S. M. Howdle, Macromolecules 46, 6843-6851 (2013). 10.1021/ma401051e
A. Y. Wu, E. Whalley, and G. Dolling, Rev. Sci. Instrum. 56, 1409-1412 (1985). 10.1063/1.1138494
W. Bao, C. Broholm, and S. F. Trevino, Rev. Sci. Instrum. 66, 1260-1261 (1995). 10.1063/1.1146019
R. G. Zielinski, M. E. Paulaitis, and E. W. Kaler, Rev. Sci. Instrum. 67, 2612-2614 (1996). 10.1063/1.1147223
D. M. Pfund, T. S. Zemanian, J. C. Linehan, J. L. Fulton, and C. R. Yonker, J. Phys. Chem. 98, 11846-11857 (1994). 10.1021/j100097a009
T. Shinkai, M. Ito, K. Sugiyama, K. Ito, and H. Yokoyama, Soft Matter 8, 5811-5817 (2012). 10.1039/c2sm07085e
D. Li, B. Han, Z. Liu, J. Liu, X. Zhang, S. Wang, and X. Zhang, Macromolecules 34, 2195-2201 (2001). 10.1021/ma0014463
D. Li, Z. Liu, B. Han, G. Yang, Z. Wu, Y. Liu, and B. Dong, Macromolecules 33, 7990-7993 (2000). 10.1021/ma000850z
J. Bauch, H. J. Ullrich, M. Bohling, and D. Reiche, Cryst. Res. Technol. 38, 440-449 (2003). 10.1002/crat.200310055
S. Wang, Y. F. Meng, N. Ando, M. Tate, S. Krasnicki, C. S. Yan, Q. Liang, J. Lai, H. K. Mao, S. M. Gruner, and R. J. Hemley, J. Appl. Crystallogr. 45, 453-457 (2012). 10.1107/S0021889812010722
W. Bras, I. P. Dolbnya, D. Detollenaere, R. van Tol, M. Malfois, G. N. Greaves, A. J. Ryan, and E. Heeley, J. Appl. Crystallogr. 36, 791-794 (2003). 10.1107/S002188980300400X
M. Borsboom, W. Bras, I. Cerjak, D. Detollenaere, D. G. van Loon, P. Goedtkindt, M. Konijnenburg, P. Lassing, Y. K. Levine, B. Munneke, M. Oversluizen, R. van Tol, and E. Vlieg, J. Synchrotron Radiat. 5, 518-520 (1998). 10.1107/S0909049597013484
C. Broennimann, E. F. Eikenberry, B. Henrich, R. Horisberger, G. Huelsen, E. Pohl, B. Schmitt, C. Schulze-Briese, M. Suzuki, T. Tomizaki, H. Toyokawa, and A. Wagner, J. Synchrotron Radiat. 13, 120-130 (2006). 10.1107/S0909049505038665
F. Furno, P. Licence, S. M. Howdle, and M. Poliakoff, Actual Chim. 4-5, 62-66 (2003).
P. Licence, M. P. Dellar, R. G. M. Wilson, P. A. Fields, D. Litchfield, H. M. Woods, M. Poliakoff, and S. M. Howdle, Rev. Sci. Instrum. 75, 3233-3236 (2004). 10.1063/1.1790563
W. Wang, R. M. T. Griffiths, M. R. Giles, P. Williams, and S. M. Howdle, Eur. Polym. J. 39, 423-428 (2003). 10.1016/S0014-3057(02)00249-5
K. Nishikawa and I. Tanaka, Chem. Phys. Lett. 244, 149-152 (1995). 10.1016/0009-2614(95)00818-O
K. Nishikawa, I. Tanaka, and Y. Amemiya, J. Phys. Chem. 100, 418-421 (1996). 10.1021/jp951803p
R. Ishii, S. Okazaki, I. Okada, M. Furusaka, N. Watanabe, M. Misawa, and T. Fukunaga, J. Chem. Phys. 105, 7011-7021 (1996). 10.1063/1.471990
O. Glatter and O. Kratky, Small Angle X-Ray Scattering (Academic Press, 1982).