Article (Scientific journals)
Doping-dependent band structure of LaAlO3/SrTiO3 interfaces by soft x-ray polarization-controlled resonant angle-resolved photoemission
Cancellieri, C.; Reinle-Schmitt, M.L.; Kobayashi, M. et al.
2014In Physical Review. B, Condensed Matter and Materials Physics, 89, p. 121412
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Abstract :
[en] Polarization-controlled synchrotron radiation was used to map the electronic structure of buried conducting interfaces of LaAlO3/SrTiO3 in a resonant angle-resolved photoemission experiment. A strong polarization dependence of the Fermi surface and band dispersions is demonstrated, highlighting different Ti 3d orbitals involved in two-dimensional (2D) conduction. Measurements on samples with different doping levels reveal different band occupancies and Fermi-surface areas.The photoemission results are directly compared with advanced first-principles calculations, carried out for different 3d-band filling levels connected with the 2D mobile carrier concentrations obtained from transport measurements, with indication of charge localization at the interface.
Disciplines :
Physics
Author, co-author :
Cancellieri, C.
Reinle-Schmitt, M.L.
Kobayashi, M.
Strocov, V.N.
Willmott, P.R.
Fontaine, Denis ;  Université de Liège - ULiège > Département de physique > Physique théorique des matériaux
Ghosez, Philippe  ;  Université de Liège - ULiège > Département de physique > Physique théorique des matériaux
Filippetti, A.
Delugas, P.
Fiorentini, V.
Language :
English
Title :
Doping-dependent band structure of LaAlO3/SrTiO3 interfaces by soft x-ray polarization-controlled resonant angle-resolved photoemission
Publication date :
2014
Journal title :
Physical Review. B, Condensed Matter and Materials Physics
ISSN :
1098-0121
eISSN :
1550-235X
Publisher :
American Physical Society, Woodbury, United States - New York
Volume :
89
Pages :
121412(R)
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 09 July 2014

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