Paper published in a book (Scientific congresses and symposiums)
Optical design of the FUV spectrographic imager for the IMAGE mission
Habraken, Serge; Jamar, Claude; Rochus, Pierre et al.
1997In Siegmund, O~H; Gummin, M~A (Eds.) Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
Peer reviewed
 

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Abstract :
[en] This paper describes the original concept and the optical design of the IMAGE mission FUV spectrographic imager (SI). The instrument goal is to spectrally separate and image the electron and proton auroras. A 30 angstrom (3 nm) spectral resolution is required to isolate the electron auroras (1356 angstrom). The proton aurora imaging requires to efficiently mask the geocoronal Lyman-alpha line (1216 angstrom), in order to image the Doppler shifted Lyman-alpha light (1217 - 1223 angstrom). A classical SI combines a telescope with a spectrometer. Our SI is consisting of a reverse combination: (1) a multi-slits Wadsworth monochromator designed to spectrally isolate the two bandwidths (electrons and protons auroras), (2) a two mirror imager with a crossed delay line detector producing the final imaging on each spectral channel.
Disciplines :
Aerospace & aeronautics engineering
Author, co-author :
Habraken, Serge ;  Université de Liège - ULiège > Département de physique > Optique - Hololab - CSL (Centre Spatial de Liège)
Jamar, Claude ;  Université de Liège - ULiège > Département d'astrophys., géophysique et océanographie (AGO) > Département d'astrophys., géophysique et océanographie (AGO)
Rochus, Pierre  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège) - Instrumentation et expérimentation spatiales
Mende, Stephen B
Lampton, Michael L
Language :
English
Title :
Optical design of the FUV spectrographic imager for the IMAGE mission
Publication date :
1997
Event name :
SPIE San Diego; July 1997
By request :
Yes
Audience :
International
Main work title :
Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
Editor :
Siegmund, O~H
Gummin, M~A
Collection name :
Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
Pages :
544-553
Peer reviewed :
Peer reviewed
Available on ORBi :
since 15 July 2009

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