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Improvement of defect detection in shearography by using Principal Component Analysis
Vandenrijt, Jean-François; Lièvre, Nicolas; Georges, Marc
2014In Proceedings of Conference on Interferometry XVII: Techniques and Analysis
Peer reviewed
 

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Disciplines :
Physics
Author, co-author :
Vandenrijt, Jean-François  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Lièvre, Nicolas
Georges, Marc ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Language :
English
Title :
Improvement of defect detection in shearography by using Principal Component Analysis
Publication date :
August 2014
Event name :
Interferometry XVII: Techniques and Analysis
Event organizer :
SPIE
Event place :
San Diego, United States
Event date :
17-19 August 2014
Audience :
International
Main work title :
Proceedings of Conference on Interferometry XVII: Techniques and Analysis
Peer reviewed :
Peer reviewed
Available on ORBi :
since 16 June 2014

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