Copyright (2008) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Review of Scientific Instruments 79 013711 (2008) and may be found at http://dx.doi.org/10.1063/1.2838584.
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[en] X-ray microfocus computed tomography (micro-CT) is recently put forward to qualitatively and quantitatively characterize the internal structure of porous materials. However, it is known that artifacts such as the partial volume effect are inherently present in micro-CT images, thus resulting in a visualization error with respect to reality. This study proposes a validation protocol that in the future can be used to quantify this error for porous structures in general by matching micro-CT tomograms to microscopic sections. One of the innovations of the protocol is the opportunity to reconstruct an interpolated micro-CT image under the same angle as the physical cutting angle of the microscopic sections. Also, a novel thresholding method is developed based on matching micro-CT and microscopic images. In this study, titanium porous structures are assessed as proof of principle. It is concluded for these structures that micro-CT visualizes 89% of the total amount of voxels (solid and pore) correctly. However, 8% represents an overestimation of the real structure and 3% are real structural features not visualized by micro-CT. When exclusively focusing on the solid fraction in both the micro-CT and microscopic images, only an overestimation of about 5% is found.
Disciplines :
Materials science & engineering
Author, co-author :
Kerckhofs, Greet ; Université de Liège - ULiège > Département d'aérospatiale et mécanique > Génie biomécanique
Schrooten, J.
Van Cleynenbreugel, T.
Lomov, S. V.
Wevers, M.
Language :
English
Title :
Validation of x-ray microfocus computed tomography as an imaging tool for porous structures.
Publication date :
2008
Journal title :
Review of Scientific Instruments
ISSN :
0034-6748
eISSN :
1089-7623
Publisher :
American Institute of Physics, United States - New York
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