[en] The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at the AGLAE facility of the Louvre Laboratory to implement these techniques with an external beam. Successively have been tested the simultaneous use of PIXE and RBS with a single beam of protons, the sequential application of PIXE with protons and RBS with 4He2+ ions and finally the simultaneous implementation of PIXE and RBS with high-energy 4He2+ ions. Several examples illustrate the benefits of these combinations of techniques.
Disciplines :
Physical, chemical, mathematical & earth Sciences: Multidisciplinary, general & others
Author, co-author :
Salomon, Joseph; Ministère de la Culture, France > Centre de Recherche et de Restauration des Musées de France
Dran, Jean-Claude
Guillou, T.
Moignard, B.
Pichon, L.
Walter, Philippe ; Université de Liège - ULiège > Centre européen en archéométrie
Mathis, François ; Université de Liège - ULiège > Centre européen en archéométrie - Physique nucléaire, atomique et spectroscopie
Language :
English
Title :
Ion-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combination
Publication date :
2008
Journal title :
Applied Physics. A, Materials Science and Processing
ISSN :
0947-8396
eISSN :
1432-0630
Publisher :
Springer Science & Business Media B.V., New York, United States - New York
