Reference : Ion-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combin...
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Multidisciplinary, general & others
http://hdl.handle.net/2268/14166
Ion-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combination
English
Salomon, Joseph [>Ministère de la Culture, France > Centre de Recherche et de Restauration des Musées de France > > >]
Dran, Jean-Claude [> > > >]
Guillou, T. [> > > >]
Moignard, B. [> > > >]
Pichon, L. [> > > >]
Walter, Philippe [Université de Liège - ULg > > Centre européen en archéométrie >]
Mathis, François mailto [Université de Liège - ULg > > Centre européen en archéométrie - Physique nucléaire, atomique et spectroscopie >]
2008
Applied Physics A : Materials Science & Processing
Springer Science & Business Media B.V.
92
1
43-50
Yes (verified by ORBi)
International
0947-8396
New York
NY
[en] The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at the AGLAE facility of the Louvre Laboratory to implement these techniques with an external beam. Successively have been tested the simultaneous use of PIXE and RBS with a single beam of protons, the sequential application of PIXE with protons and RBS with 4He2+ ions and finally the simultaneous implementation of PIXE and RBS with high-energy 4He2+ ions. Several examples illustrate the benefits of these combinations of techniques.
http://hdl.handle.net/2268/14166
10.1007/s00339-008-4512-4

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