Present and future role of ion beam analysis in the study of cultural heritage materials: The example of th AGLAE facility
English
Salomon, Joseph[>Ministère de la Culture, France > > >Centre de Rencherche et de Restauration des Musées de France > > >]
Dran, Jean-Claude[Centre National de la Recherche Scientifique - CNRS > > >Laboratoire du Centre de Recherche et de Restauration des Musées de France - UMR 171 > > >]
[en] The application of IBA to cultural heritage mostly relies on the use of PIXE because of its high sensitivity and its ease of implementation at atmospheric pressure. The need for depth information not easily available with this technique has conducted to associate RBS also in external beam mode. We have progressively developed a set-up that permits such a combination of techniques either simultaneously or sequentially. The set-up is currently further improved to permit NRA measurement (depth profiles of light elements) in addition to PIXE and RBS. The coupling of all these techniques provides a wealth of information on cultural heritage objects, not easily attainable with any other single method.