Article (Scientific journals)
Present and future role of ion beam analysis in the study of cultural heritage materials: The example of th AGLAE facility
Salomon, Joseph; Dran, Jean-Claude; Guillou, T. et al.
2008In Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms, 266, p. 2273-2278
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Abstract :
[en] The application of IBA to cultural heritage mostly relies on the use of PIXE because of its high sensitivity and its ease of implementation at atmospheric pressure. The need for depth information not easily available with this technique has conducted to associate RBS also in external beam mode. We have progressively developed a set-up that permits such a combination of techniques either simultaneously or sequentially. The set-up is currently further improved to permit NRA measurement (depth profiles of light elements) in addition to PIXE and RBS. The coupling of all these techniques provides a wealth of information on cultural heritage objects, not easily attainable with any other single method.
Disciplines :
Physical, chemical, mathematical & earth Sciences: Multidisciplinary, general & others
Author, co-author :
Salomon, Joseph;  Ministère de la Culture, France > Centre de Rencherche et de Restauration des Musées de France
Dran, Jean-Claude;  Centre National de la Recherche Scientifique - CNRS > Laboratoire du Centre de Recherche et de Restauration des Musées de France - UMR 171
Guillou, T.
Moignard, B.
Pichon, L.
Walter, Philippe ;  Université de Liège - ULiège > Centre européen en archéométrie
Mathis, François ;  Université de Liège - ULiège > Centre européen en archéométrie - Physique nucléaire, atomique et spectroscopie
Language :
English
Title :
Present and future role of ion beam analysis in the study of cultural heritage materials: The example of th AGLAE facility
Publication date :
2008
Journal title :
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
ISSN :
0168-583X
eISSN :
1872-9584
Publisher :
Elsevier, Amsterdam, Netherlands
Volume :
266
Pages :
2273-2278
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 09 June 2009

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