Reference : Robustness of the scanning second harmonic generation microscopy technique for charac...
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/132292
Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
English
Valev, VK [Katholieke Universiteit Leuven - KUL > > > >]
De Clercq, B [Universiteit Hasselt - UH > > > >]
Zheng, X [Katholieke Universiteit Leuven - KUL > > > >]
Biris, CG [University College London - UCL > > > >]
Panoiu, NC [University College London - UCL > > > >]
Silhanek, Alejandro mailto [Université de Liège - ULg > Département de physique > Physique de la matière condensée >]
Volskiy, V [Katholieke Universiteit Leuven - KUL > > > >]
Aktsipetrov, OA [Lomonosov Moscow State University - MSU > > > >]
Vandenbosch, GAE [Katholieke Universiteit Leuven - KUL > > > >]
Ameloot, M [Universiteit Hasselt - UH > > > >]
Moshchalkov, VV [Katholieke Universiteit Leuven - KUL > > > >]
Verbiest, T [Katholieke Universiteit Leuven - KUL > > > >]
2012
Proceedings of SPIE
International Society for Optical Engineering
8424
842411
Yes
International
0277-786X
1996-756X
Bellingham
WA
[en] plasmonics
[en] Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.
Researchers
http://hdl.handle.net/2268/132292

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