You are here:
| Reference : SIME : a comprehensive approach to fast transient stability assessment |
| Scientific congresses and symposiums : Paper published in a book | |||
| Engineering, computing & technology : Electrical & electronics engineering | |||
| http://hdl.handle.net/2268/129513 | |||
| SIME : a comprehensive approach to fast transient stability assessment | |
| English | |
| Zhang, Y. [] | |
Rousseaux, Patricia  [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Système et modélisation >] | |
| Wehenkel, Louis [Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes et modélisation >] | |
| Pavella, Mania [Université de Liège - ULg > Services généraux (Faculté des sciences appliquées) > Relations académiques et scientifiques (Sciences appliquées) >] | |
| 1996 | |
| Proceeding of the IEE Japan'96 Conference | |
| 177-182 | |
| IEE Japan'96 Conference | |
| August 7-9 | |
| IEE of Japan | |
| Osaka | |
| Japan | |
| Researchers ; Professionals ; Students | |
| http://hdl.handle.net/2268/129513 |
There is no file associated with this reference.
All documents in ORBi are protected by a user license.
